{"version":"1.0","provider_name":"EENewsEurope","provider_url":"https:\/\/test.ecinews.fr\/fr\/","author_name":"eeNews Europe","author_url":"https:\/\/test.ecinews.fr\/fr\/author\/eenews-europe\/","title":"Testeur \u00e0 sondes mobiles pour circuits imprim\u00e9s nus","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"vdHhEOskd2\"><a href=\"https:\/\/test.ecinews.fr\/fr\/testeur-a-sondes-mobiles-pour-circuits-imprimes-nus\/\">Testeur \u00e0 sondes mobiles pour circuits imprim\u00e9s nus<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/test.ecinews.fr\/fr\/testeur-a-sondes-mobiles-pour-circuits-imprimes-nus\/embed\/#?secret=vdHhEOskd2\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Testeur \u00e0 sondes mobiles pour circuits imprim\u00e9s nus\u00a0\u00bb &#8212; EENewsEurope\" data-secret=\"vdHhEOskd2\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/test.ecinews.fr\/wp-content\/uploads\/import\/default\/files\/import\/eci3703_seica_rapid270-scaled.jpg","thumbnail_width":2560,"thumbnail_height":1747,"description":"Seica vient d\u2019introduire la gamme de testeurs \u00e0 sondes mobiles RAPID d\u00e9di\u00e9s au test \u00e9lectrique de PCB (Printed Circuit Board). Cette gamme de testeurs utilise une nouvelle technologie dite Ultra Fast, con\u00e7ue autour d\u2019un nouveau design pour une ergonomie am\u00e9lior\u00e9e. Cette technologie est bas\u00e9e sur un stimuli et syst\u00e8me de mesure innovant qui est directement install\u00e9 sur les sondes mobiles, donc tr\u00e8s proche du circuit sous test. L\u2019utilisation de DSP permet de communiquer en temps r\u00e9el, et de faire des mesures capacitives, r\u00e9sistives et inductives d\u2019une grande pr\u00e9cision."}