{"id":225892,"date":"2012-12-17T23:00:00","date_gmt":"2012-12-17T23:00:00","guid":{"rendered":"https:\/\/eenewseurope.artwhere.co\/testway-express-genere-les-programmes-de-test-et-dassemblage\/"},"modified":"2012-12-17T23:00:00","modified_gmt":"2012-12-17T23:00:00","slug":"testway-express-genere-les-programmes-de-test-et-dassemblage","status":"publish","type":"post","link":"https:\/\/test.ecinews.fr\/fr\/testway-express-genere-les-programmes-de-test-et-dassemblage\/","title":{"rendered":"TestWay Express g\u00e9n\u00e8re les programmes de test et d’assemblage"},"content":{"rendered":"

TestWay Express permet aussi de mesurer la couverture réelle d’un programme de test post-debug, de comparer l’estimation initiale avec la mesure réelle de la couverture du programme de test, et d’identifier les manques ou les redondances dans la stratégie globale.
\nL’opportunité de générer des programmes de test " Lean " représente des avantages significatifs pour les testeurs à sondes mobiles Takaya :
\n– Réduire le temps de mise au point : capacité réelle de différents modèles de testeur, algorithme automatique de création de tests (ATPG), sélection de l’angle optimal de la sonde du testeur, réduction des temps de debug, augmentant ainsi la disponibilité du testeur pour la production.
\n– Augmenter la couverture de test : identification automatique de " cluster " simple via des composants de faible valeur résistive.
\n– Réduire l’effort d’ingénierie : modélisation simplifiée des composants, placement automatisé des sondes.
\n– Réduire les temps de test : analyse des connexions pour identifier la technique de mesure la plus efficace pour détecter les défauts sans tests superflus. Puissant analyseur de couverture pour optimiser la répartition des tests sur plusieurs moyens. C’est la clef d’une réelle stratégie " Lean " visant à identifier et à éliminer les gaspillages jalonnant la chaîne de la valeur ajoutée.<\/p>\n

TestWay Express supporte un large choix d’équipements d’assemblage, d’inspection et de test : Acculogic; Aeroflex: 4200; Agilent: i3070; Assembléon; Asset; Checksum; Corelis; Goepel; JTAG Technologies; Mirtec; MyData; Spea: 3030\/4030\/4040; Temento; Takaya: APT8400\/94xx\/9600; Teradyne: GR228x\/TS12x, Spectrum, Z1800; TRI: 518\/5001\/8001.<\/p>\n

www.aster-technologies.com<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

TestWay Express est une solution totalement int\u00e9gr\u00e9e qui permet aux fabricants de cartes \u00e9lectroniques d’optimiser le lien Design to Test. Cette solution d\u00e9finit la ligne de fabrication incluant une combinaison d’\u00e9quipements d’assemblage, d’inspection ou de test. Elle place les points de test judicieusement pour maximiser la couverture de test et minimiser le co\u00fbt des interfaces de test, et permet d’estimer la couverture de test de chaque \u00e9tape et optimiser le r\u00e9sultat combin\u00e9. 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Elle place les points de test judicieusement pour maximiser la couverture de test et minimiser le co\u00fbt des interfaces de test, et permet d'estimer la couverture de test de chaque \u00e9tape et optimiser le r\u00e9sultat combin\u00e9. 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